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Research on a Novel Cone-Beam CT Imaging Method Based on Dual-Layer Flat Panel Detectors
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Reporter:
Yongshuai Ge, Professor, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences
Inviter:
Chong Chen, Associate Professor
Subject:
Research on a Novel Cone-Beam CT Imaging Method Based on Dual-Layer Flat Panel Detectors
Time and place:
14:00-15:00 October 23(Thursday), S817
Abstract:

Dual-energy cone-beam CT (CBCT) is at the forefront of development in this field. However, existing dual-energy CBCT still suffers from the bottleneck of low spatial resolution, resulting in imaging performance that fails to meet clinical needs. To overcome these challenges, we propose two different high-resolution dual-energy CBCT imaging schemes based on dual-layer flat-panel detectors: one based on subpixel shifting and the other based on detector self-amplification. Experimental results demonstrate that both methods significantly improve image resolution of dual-energy CBCT, promoting the development of medical dual-energy CBCT imaging technology and systems.